Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Stephen J. B. Reed

192 pages, parution le 09/08/2005 (2^eme édition)

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Résumé

Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint.

Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

L'auteur - Stephen J. B. Reed

Stephen Reed is affiliated to the Department of Earth Sciences at the University of Cambridge. He has spent over 40 years practising and researching EMPA and electron detectors (ED). After studying physics at Southampton University, he gained a Ph.D. from the University of Cambridge in 1964 for research in using EMPA to analyse iron meteorites. He went on to be a Scientific Officer at the Natural History Museum, London from 1965 to 1970 before his appointment as Senior Research Fellow at the Australian National University, Canberra, where he implemented a new system for quantitative ED analysis. From 1974 until his retirement in 2002, Dr Reed was at the Department of Earth Sciences, University of Cambridge, with research interests including ion and electron microprobe analysis and developing simulation software. In 1981 he was awarded the Microbeam Analysis Society Presidential Award for his outstanding scientific contribution to the theory and practice of microbeam analysis, followed in 1984 by honorary life membership. He has written several books on the subject, including Electron Microprobe Analysis (Cambridge 1975, second edition 1993).

Sommaire

Preface
Acknowledgments
Introduction
Electron-specimen interactions
Instrumentation
Scanning electron microscopy
X-ray spectrometers
Element mapping
X-ray analysis (1)
X-ray analysis (2)
Sample preparation
Appendix
References
Index

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Caractéristiques techniques

	PAPIER
Éditeur(s)	Cambridge University Press
Auteur(s)	Stephen J. B. Reed
Parution	09/08/2005
Édition	2^eme édition
Nb. de pages	192
Format	18 x 25
Couverture	Relié
Poids	588g
Intérieur	Noir et Blanc
EAN13	9780521848756
ISBN13	978-0-521-84875-6