Introduction To Mixed-Signal Test and Measurement

Contents

• Chapter 1: Overview of Mixed-Signal Testing
• 1.1 Mixed-Signal Ciruits
• 1.2 Why Test Mixed-Signal Devices
• 1.3 Post-Silicon Production Flow
• 1.4 Test and Diagnostic Equipment
• 1.5 New Product Development
• 1.6 Mixed-Signal Testing Challenges
• Chapter 2: The Test Specification Process
• 2.1 Device Data Sheets
• 2.2 Generating the Test Plan
• 2.3 Components of a Test Program
• 2.4 Summary
• Chapter 3: DC and Parametric Measurements
• 3.1 Continuity
• 3.2 Leakage Currents
• 3.3 Power Supply Currents
• 3.4 DC References and Regulators
• 3.5 Impedance Measurements
• 3.6 DC Offset Measurements
• 3.7 DC Gain Measurements
• 3.8 DC Power Supply Rejection Ratio
• 3.9 DC Common Mode Rejection Ratio
• 3.10 Comparator DC Tests
• 3.11 Voltage Search Techniques
• 3.12 DC Tests for Digital Circuits
• 3.13 Summary
• Chapter 4: Measurement Accuracy
• 4.1 Terminology
• 4.2 Calibrations and Checkers
• 4.3 Dealing with Measurement Error
• 4.4 Basic Data Analysis
• 4.5 Summary
• Chapter 5: Tester Hardware
• 5.1 Mixed-Signal Tester Overview
• 5.2 DC Resources
• 5.3 Digital Subsystem
• 5.4 AC Source and Measurement
• 5.5 Time Measurement System
• 5.6 Computing Hardware
• 5.7 Summary
• Chapter 6: Sampling Theory
• 6.1 Analog Measurements Using DSP
• 6.2 Sampling and Reconstruction
• 6.3 Repetitive Sample Sets
• 6.4 Synchronization of Sampling Systems
• 6.5 Summary
• Chapter 7: DSP-Based Testing
• 7.1 Advantages of DSP-Based Testing
• 7.2 Digital Signal Processing
• 7.3 Discrete-Time Transforms
• 7.4 The Inverse FFT
• 7.5 Summary
• Chapter 8: Analog Channel Testing
• 8.1 Overview
• 8.2 Gain and Level Tests
• 8.3 Phase Tests
• 8.4 Distortion Tests
• 8.5 Signal Rejection Tests
• 8.6 Noise Tests
• 8.7 Simulation of Analog Channel Tests
• 8.8 Summary
• Chapter 9: Sampled Channel Testing
• 9.1 Overview
• 9.2 Sampling Considerations
• 9.3 Encoding and Decoding
• 9.4 Sampled Channel Tests
• 9.5 Summary
• Chapter 10: Focused Calibrations
• 10.1 Overview
• 10.2 DC Calibrations
• 10.3 AC Amplitude Calibrations
• 10.4 Other AC Calibrations
• 10.5 Error Cancellation Techniques
• 10.6 Summary
• Chapter 11: DAC Testing
• 11.1 Basics of Converter Testing
• 11.2 Basic DC Tests
• 11.3 Transfer Curve Tests
• 11.4 Dynamic DAC Tests
• 11.5 DAC Architectures
• 11.6 Summary
• Chapter 12: ADC Testing
• 12.1 ADC Testing Versus DAC Testing
• 12.2 ADC Code Edge Measurements
• 12.3 DC Tests and Transfer Curve Tests
• 12.4 Dynamic ADC Tests
• 12.5 ADC Architectures
• 12.6 Tests for Common ADC Applications
• 12.7 Summary
• Chapter 13: DIB Design
• 13.1 DIB Basics
• 13.2 Printed Circuit Boards (PCBS)
• 13.3 DIB Traces, Shields, and Guards
• 13.4 Transmission Lines
• 13.5 Grounding and Power Distribution
• 13.6 DIB Components
• 13.7 Common DIB Circuits
• 13.8 Common DIB Mistakes
• 13.9 Summary
• Chapter 14: Design for Test (DfT)
• 14.1 Overview
• 14.2 Advantages of DfT
• 14.3 Digital Scan
• 14.4 Digital BIST
• 14.5 Digital DfT for Mixed-Signal Circuits
• 14.6 Mixed-Signal Boundary Scan and BIST
• 14.7 Ad Hoc Mixed-Signal DfT
• 14.8 Subtle Forms of Analog DFT
• 14.9 IDDQ
• 14.10 Summary
• Chapter 15: Data Analysis
• 15.1 Introduction to Data Analysis
• 15.2 Data Visualization Tools
• 15.3 Statistical Analysis
• 15.4 Statistical Process Control (SPC)
• 15.5 Summary
• Chapter 16: Test Economics
• 16.1 Profitability Factors
• 16.2 Direct Testing Costs
• 16.3 Debugging Skills
• 16.4 Emerging Trends
• 16.5 Summary