Generalized Linear Models with Random Effects

Unified Analysis via H-likelihood

Youngjo Lee, John A. Nelder, Yudi Pawitan - Collection Monographs on Statistics and Applied Probability

400 pages, parution le 15/12/2006

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Résumé

Since their introduction in 1972, generalized linear models (GLMs) have proven useful in the generalization of classical normal models. Presenting methods for fitting GLMs with random effects to data, Generalized Linear Models with Random Effects: Unified Analysis via H-likelihood explores a wide range of applications, including combining information over trials (meta-analysis), analysis of frailty models for survival data, genetic epidemiology, and analysis of spatial and temporal models with correlated errors.

Written by pioneering authorities in the field, this reference provides an introduction to various theories and examines likelihood inference and GLMs. The authors show how to extend the class of GLMs while retaining as much simplicity as possible. By maximizing and deriving other quantities from h-likelihood, they also demonstrate how to use a single algorithm for all members of the class, resulting in a faster algorithm as compared to existing alternatives.

Complementing theory with examples, many of which can be run by using the code supplied on the accompanying CD, this book is beneficial to statisticians and researchers involved in the above applications as well as quality-improvement experiments and missing-data analysis.

L'auteur - Youngjo Lee

Youngjo Lee Seoul National University, Korea

L'auteur - John A. Nelder

John A. Nelder Imperial College, London, UK

L'auteur - Yudi Pawitan

Yudi Pawitan: Karolinska Institute, Stockholm, Sweden

Sommaire

Classical likelihood theory
Generalized linear models
Quasi-likelihood
Extended likelihood inferences
Normal linear mixed models
Hierarchical GLMs
HGLMs with structured dispersion
Correlated random effects for HGLMs
Smoothing
Random-effect models for survival data
Double HGLMs
Further topics

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Caractéristiques techniques

	PAPIER
Éditeur(s)	CRC Press (Taylor and Francis Group)
Auteur(s)	Youngjo Lee, John A. Nelder, Yudi Pawitan
Collection	Monographs on Statistics and Applied Probability
Parution	15/12/2006
Nb. de pages	400
Format	16 x 24
Couverture	Relié
Poids	700g
Intérieur	Noir et Blanc
EAN13	9781584886310
ISBN13	978-1-58488-631-0