Résumé
Table of Contents
- Preface.....vii
- Introduction.....ix
- Microprocessors in the Auto Industry.....ix
- Microprocessors in the Air Travel Industry.....x
- Microprocessors in the Games Market.....x
- Why Embedded Systems Are Different.....x
- Summary.....xix
- Chapter 1:
- The Embedded Design Life Cycle.....1
- Introduction.....1
- Product Specification.....4
- Hardware/Software Partitioning.....7
- Iteration and Implementation.....10
- Detailed Hardware and Software Design.....11
- Hardware/Software Integration.....12
- Product Testing and Release.....15
- Who Does the Testing?.....17
- Maintaining and Upgrading Existing Products.....17
- Summary.....19
- Work Cited.....19
- Chapter 2:
- The Selection Process.....21
- Packaging the Silicon.....23
- Microprocessor versus Microcontroller.....24
- Silicon Economics.....25
- Using the Core As the Basis of a Microcontroller.....25
- System-on-Silicon (SoS).....26
- Adequate Performance.....26
- Performance-Measuring Tools.....26
- Meaningful Benchmarking.....28
- Running Benchmarks.....31
- RTOS Availability.....32
- Language/Microprocessor Support.....32
- Tool Compatibility.....34
- Performance.....35
- Device Drivers.....35
- Debugging Tools.....36
- Standards Compatibility.....36
- Technical Support.....36
- Source Code versus Object Code.....37
- Services.....37
- Tool Chain Availability.....38
- Compilers.....39
- Hardware and Software Debugging Tools.....40
- Other Issues in the Selection Process.....41
- A Prior Commitment to a Particular Processor Family.....41
- A Prior Restriction on Language.....42
- Time to Market.....42
- Additional Reading.....44
- Summary.....45
- Works Cited.....45
- Chapter 3:
- The Partitioning Decision.....47
- Hardware/Software Duality.....48
- Hardware Trends.....50
- "Coding" Hardware.....52
- The ASIC Revolution.....55
- ASICs and Revision Costs.....57
- Managing the Risk.....59
- Co-Verification.....61
- Additional Reading.....66
- Summary.....66
- Works Cited.....67
- Chapter 4:
- The Development Environment.....69
- Introduction.....69
- The Execution Environment.....70
- Memory Organization.....70
- System Space.....71
- Code Space.....71
- Data Space.....71
- Unpopulated Memory Space.....72
- I/O Space.....73
- System Startup.....73
- Interrupt Response Cycle.....74
- Function Calls and Stack Frames.....75
- Run-Time Environment.....78
- Object Placement.....82
- Additional Reading.....86
- Summary.....87
- Works Cited.....88
- Chapter 5:
- Special Software Techniques.....89
- Manipulating the Hardware.....89
- Inline Assembly.....90
- Memory-Mapped Access.....91
- Bitwise Operations.....92
- Using the Storage Class Modifier Volatile.....93
- Speed and Code Density.....94
- Interrupts and Interrupt Service Routines (ISRs).....96
- From Polling Loop to Interrupt-Driven.....96
- Nested Interrupts and Reentrancy.....97
- Measuring Execution Time.....99
- Watchdog Timers.....101
- Watchdog Timer: Debugging the Target System.....102
- Flash Memory.....102
- Design Methodology.....104
- Additional Reading.....107
- Summary.....108
- Works Cited.....108
- Chapter 6:
- A Basic Toolset.....111
- Host-Based Debugging.....112
- Word Size.....112
- Byte Order.....112
- Remote Debuggers and Debug Kernels.....116
- ROM Emulator.....122
- Limitations.....124
- Intrusiveness and Real-Time Debugging.....125
- Logic Analyzer.....130
- Timing Mode.....130
- State Mode.....132
- Triggers.....133
- State Transitions.....137
- Limitations.....139
- Physical Connections.....139
- Logic Analyzers and Caches.....140
- Compiler Optimizations.....143
- Cost Benefit.....143
- Other Uses.....143
- Statistical Profiling.....144
- Summary.....147
- Works Cited.....148
- Chapter 7:
- BDM, JTAG, and Nexus.....149
- Background Debug Mode.....150
- Joint Test Action Group (JTAG).....155
- Nexus.....160
- Summary.....165
- Chapter 8:
- The ICE - An Integrated Solution.....167
- Bullet-Proof Run Control.....168
- Real-Time Trace.....170
- Hardware Breakpoints.....174
- Overlay Memory.....176
- Timing Constraints.....179
- Usage Issues.....182
- Setting the Trigger.....183
- Additional Reading.....184
- Summary.....184
- Work Cited.....185
- Chapter 9:
- Testing.....187
- Introduction.....187
- Why Test?.....187
- To Find the Bugs.....188
- To Reduce Risk.....188
- To Reduce Costs.....189
- To Improve Performance.....190
- When to Test?.....190
- Unit Testing.....190
- Regression Testing......190
- Which Tests?.....191
- When to Stop?.....192
- Choosing Test Cases.....193
- Functional Tests.....193
- Coverage Tests.....194
- Testing Embedded Software.....196
- Real-Time Failure Modes.....198
- Measuring Test Coverage.....199
- Performance Testing.....205
- How to Test Performance.....206
- Maintenance and Testing.....210
- Additional Reading.....211
- Summary.....211
- Works Cited.....212
- Chapter 10:
- The Future.....213
- Reconfigurable Hardware.....213
- Some Comments on the Tool Business.....218
- Tool/Chip Tension.....224
- Summary.....228
- Works Cited.....229
- Index
L'auteur - Arnold S Berger
Arnold S. Berger is a Senior Lecturer in the Computing and Software Systems Department at the University of Washington-Bothell. He received his BS and PhD degrees from Cornell University. Dr. Berger has held positions as an R&D Director at Applied Microsystems Corporation, Embedded Tools Marketing Manager at Advanced Micro DeviceSj-and R&D Project Manager at Hewlett-Packard. Dr. Berger has published over 40 papers on embedded systems. He holds three patents and is the author of the popular title, Embedded Systems Design: An Introduction to Processes, Tools and Techniques.
Caractéristiques techniques
PAPIER | |
Éditeur(s) | Mc Graw Hill |
Auteur(s) | Arnold S Berger |
Parution | 26/12/2001 |
Nb. de pages | 238 |
Format | 18,5 x 23,5 |
Couverture | Broché |
Poids | 441g |
Intérieur | Noir et Blanc |
EAN13 | 9781578200733 |
ISBN13 | 978-1-57820-073-3 |
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