Data Mining and Diagnosing IC Fails

Leendert M. Huisman

270 pages, parution le 31/03/2006

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Résumé

There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose.

Data Mining and Diagnosing IC Fails addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences.

The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.

Sommaire

Introduction
Statistics
Yield Statistics
Area Dependence of the Yield
Statistics of Embedded Object Fails
Fail Commonalities
Spatial Patterns
Test Coverage and Test Fallout
Logic Diagnosis
Slat Based Diagnosis
Data Collection Requirements
Appendix A: Distribution of IC Fails
Appendix B: General Yield Model
Appendix C: Simplified Center-Satellite Model
Appendix D: Quadrat Analysis
Appendix E: Cell Fail Probabilities
Appendix F: Characterization Group
Appendix G: Component Fail Probabilities
Appendix H: Yield and Coverage
Appendix I: Estimating First Fail Probabilities from the Fallout
Appendix J: Identity of M and S
References
Index

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Caractéristiques techniques

	PAPIER
Éditeur(s)	Springer
Auteur(s)	Leendert M. Huisman
Parution	31/03/2006
Nb. de pages	270
Format	16 x 24
Couverture	Relié
Poids	576g
Intérieur	Noir et Blanc
EAN13	9780387249933
ISBN13	978-0-387-24993-3