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ESD in Silicon Integrated Circuits
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Librairie Eyrolles - Paris 5e
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ESD in Silicon Integrated Circuits

ESD in Silicon Integrated Circuits

Ajith Amerasekera, Charvaka Duvvury

412 pages, parution le 02/05/2002 (2eme édition)

Résumé

As high density circuits move deeper into submicron dimensions Electrostatic Discharge (ESD) effects become an increasing concern. This new edition of a classic reference presents a practical and systematic approach to ESD device physics, modelling and design techniques. The authors draw upon their wealth of industrial experience to provide a complete overview of ESD and its implications in the development of advanced integrated circuits.

Fully revised to incorporate the latest industry achievements and featuring:

  • Design methods for a variety of technologies from 1 micron to the current sub-micron regimes, along with complete design approaches for MOS, BiCMOS and Power MOSFETs.
  • New sections on ESD design rules, process technology effects, layout approaches, package effects and circuit simulations.
  • Guidance on the implementation of circuit protection measures for a range of I/O configurations.
Detailed coverage of ESD simulation stress models.
This unique reference provides the means to design protection circuits for a variety of applications and to diagnose and solve ESD problems in IC products. The coverage of state-of-the-art circuit design for ESD prevention will appeal to engineers and scientists working in the fields of IC and transistor design. Graduate students and researchers in device/circuit modeling and semiconductor reliability will appreciate this comprehensive coverage of ESD fundamentals.

Contents

  • 1. Introduction
  • 2. ESD Phenomenon
  • 3. Test Methods
  • 4 Physics and Operation of ESD Protection Circuits
  • 5 ESD Protection Design Concepts and Strategy
  • 6 Design and Layout Requirements
  • 7 Advanced Protection Design
  • 8 Failure Modes, Reliability Issues, and Case Studies
  • 9 Influence of Processing on ESD
  • 10 Device Modeling of High Current Effects
  • 11 Circuit Simulation Basics, Approaches, and Simulations
  • 12 Conclusions

Caractéristiques techniques

  PAPIER
Éditeur(s) Wiley
Auteur(s) Ajith Amerasekera, Charvaka Duvvury
Parution 02/05/2002
Édition  2eme édition
Nb. de pages 412
Format 17 x 25
Couverture Relié
Poids 927g
Intérieur Noir et Blanc
EAN13 9780471498711
ISBN13 978-0-471-49871-1

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