Tous nos rayons

Déjà client ? Identifiez-vous

Mot de passe oublié ?

Nouveau client ?

CRÉER VOTRE COMPTE
Microstructural Characterization of Materials
Ajouter à une liste

Librairie Eyrolles - Paris 5e
Indisponible

Microstructural Characterization of Materials

Microstructural Characterization of Materials

David Brandon, Wayne D. Kaplan

410 pages, parution le 28/04/1999

Résumé

The internal microstructure and the microstructural features of materials are of key importance when analysing a material for a given engineering application. In specifying the internal microstructure of a material the chemistry, the crystallography, and the structural morphology need to be considered. For each of these aspects, there are three equally important stages of investigation - specimen preparation, image observation and recording, and the analysis and interpretation of recorded data.

Microstructural Characterization of Materials is an integrated treatment of the science of microstructural characterization which emphasizes the interaction of the specimen with the radiation used to probe the microstructure. The three main aspects of microstructural morphology, phase identification and crystallography, and microanalysis of the chemical composition are all covered in detail. Following an introductory chapter, the principal methods of characterization which are commonly available in a well-equipped laboratory are treated in full. These include diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques.

Microstructural Characterization of Materials will be of great value to both undergraduate and graduate students and includes suitable problems for students exercises. More advanced researchers will also find it highly useful as a general reference source.

Sommaire

  • The Concept of Microstructure
  • Diffraction Analysis of Crystal Structure
  • Optical Microscopy
  • Electron Microscopy
  • Microanalysis in Electron Microscopy
  • Chemical Analysis of Surface Composition
  • Quantitative Analysis of Microstructure
  • Appendices
  • Index
Voir tout
Replier

Caractéristiques techniques

  PAPIER
Éditeur(s) Wiley
Auteur(s) David Brandon, Wayne D. Kaplan
Parution 28/04/1999
Nb. de pages 410
Format 15 x 23
Couverture Broché
Poids 624g
Intérieur Noir et Blanc
EAN13 9780471985020
ISBN13 978-0-471-98502-0

Avantages Eyrolles.com

Livraison à partir de 0,01 en France métropolitaine
Paiement en ligne SÉCURISÉ
Livraison dans le monde
Retour sous 15 jours
+ d'un million et demi de livres disponibles
satisfait ou remboursé
Satisfait ou remboursé
Paiement sécurisé
modes de paiement
Paiement à l'expédition
partout dans le monde
Livraison partout dans le monde
Service clients sav.client@eyrolles.com
librairie française
Librairie française depuis 1925
Recevez nos newsletters
Vous serez régulièrement informé(e) de toutes nos actualités.
Inscription