Applied Scanning Probe Methods

Bharat Bhushan, Harald Fuchs, Sumio Hosaka - Collection NanoScience and Technology

476 pages, parution le 22/01/2004

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Résumé

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations.
The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.

Written for:
Professionals in industry dealing with surface analytics. Scientists at universities in physical chemistry/physics, materials science, polymer science departments.

L'auteur - Bharat Bhushan

Editor

L'auteur - Harald Fuchs

Editor

Sommaire

Part I Scanning Probe Microscopy
- Dynamic Force Microscopy
- Interfacial Force Microscopy: Selected Applications
- Atomic Force Microscopy with Lateral Modulation
- Sensor Technology for Scanning Probe Microscopy
- Tip Characterization for Dimensional Nanometrology
Part II Characterization
- Micro/Nanotribology Studies Using Scanning Probe Microscopy
- Visualization of Polymer Structures with Atomic Force Microscopy
- Displacement and Strain Field Measurements from SPM Images
- AFM Characterization of Semiconductor Line Edge Roughness
- Mechanical Properties of Self-Assembled Organic Monolayers: Experimental Techniques and Modeling Approaches
- Micro-Nano Scale Thermal Imaging Using Scanning Probe Microscopy
- The Science of Beauty on a Small Scale. Nanotechnologies Applied to Cosmetic Science
Part III Industrial Applications
- SPM Manipulation and Modifications and Their Storage Applications
- Super Density Optical Data Storage by Near-Field Optics
- Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance Microscope (SCM)
- Room-Temperature Single-Electron Devices formed by AFM Nano-Oxidation Process

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Caractéristiques techniques

	PAPIER
Éditeur(s)	Springer
Auteur(s)	Bharat Bhushan, Harald Fuchs, Sumio Hosaka
Collection	NanoScience and Technology
Parution	22/01/2004
Nb. de pages	476
Format	16 x 24
Couverture	Relié
Poids	820g
Intérieur	Noir et Blanc
EAN13	9783540005278