
Résumé
Optical interferometry is used in communications, medical imaging, astonomy, and structural measurement. With the use of an interferometer engineers and scientists are able to complete surface inspections of micromachined surfaces and semiconductors. Medical technicians are able to give more consise diagnoses with the employ of interferometers in microscopy, spectroscopy, and coherent tomography.
Originating from a one-day course, this material was expanded to serve as an introduction to the topic for engineers and scientists that have little optical knowledge but a need for more in their daily work lives. The need for interferometry knowledge has crossed the boundaries of engineering fields and Dr. Hariharan has written a book that answers the questions that new practitioners to interferometry have and haven't even thought of yet. This new edition includes complete updates of all material with an emphasis on applications. It also has new chapters on white-light microsopy and interference with single photons.
L'auteur - P. Hariharan
Dr. Parameswaran Hariharan School of Physics, University of Sydney, Sydney, Australia. Professor P. Hariharan is a Research Fellow in the Division of Telecommunications and Industrial Physics of CSIRO in Sydney and a Visiting Professor at the University of Sydney. His main research interests are interferometry and holography. He is a Fellow of SPIE (The International Society for Optical Engineering), the Optical Society of America (OSA), the Institute of Physics, London, and the Royal Photographic Society. He was a vice-president and then the treasurer of the International Commission of Optics, as well as a director of SPIE. Honors he has received include OSA's Joseph Fraunhofer Award, the Henderson Medal of the Royal Photographic Society, the Thomas Young Medal of the Institute of Physics, London, SPIE's Dennis Gabor Award and, most recently, SPIE's highest award, the Gold Medal.
Sommaire
- Introduction
- Interference: A Primer
- Two-Beam Interferometers
- Source-Size and Spectral Effects
- Multiple-Beam Interference
- The Laser as a Light Source
- Photodetectors
- Measurements of Length
- Optical Testing
- Digital Techniques
- Macro- and Micro-Interferometry
- White-Light Interference Microscopy
- Holographic and Speckle Interferometry
- Interferometric Sensors
- Interference Spectroscopy
- Fourier-Transform Spectroscopy
- Interference with Single Photons
- Building an Interferometer
- Appendix A: Monochromatic Light Waves
- Appendix B: Phase Shifts on Reflections
- Appendix C: Diffraction
- Appendix D: Polarized Light
- Appendix E: The Pancharatnam Phase
- Appendix F: The Twyman-Green Interferometer: Initial Adjustment
- Appendix G: The Mach-Zehnder Interferometer: Initial Adjustment
Caractéristiques techniques
PAPIER | |
Éditeur(s) | Academic Press |
Auteur(s) | P. Hariharan |
Parution | 29/11/2006 |
Édition | 2eme édition |
Nb. de pages | 248 |
Format | 16 x 23,5 |
Couverture | Relié |
Poids | 510g |
Intérieur | Noir et Blanc |
EAN13 | 9780123735898 |
ISBN13 | 978-0-12-373589-8 |
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