Extended Defects in Semiconductors

Electronic Properties, Device Effects and Structures

David B. Holt, Ben Yacobi

644 pages, parution le 01/04/2007

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Résumé

The elucidation of the effects of structurally extended defects on electronic properties of materials is especially important in view of the current advances in electronic device development that involve defect control and engineering at the nanometer level. This book surveys the properties, effects, roles and characterization of extended defects in semiconductors. The basic properties of extended defects (dislocations, stacking faults, grain boundaries, and precipitates) are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. These topics are among the central issues in the investigation and applications of semiconductors and in the operation of semiconductor devices. The authors preface their treatment with an introduction to semiconductor materials and conclude with a chapter on point defect maldistributions. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.

A comprehensive survey, in one volume, of extended structural defects in semiconductors - Suitable as a reference text for researchers but also as a textbook for graduate students - Timely, in view of advances in electronic device development, which involve defect control and engineering at the nanometer level

Sommaire

Semiconducting materials
An introduction to extended defects
Characterization of extended defects in semiconductors
Core structures and mechanical effects of extended defects specific to semiconductors
The electrical, optical and device effects of dislocations and grain boundaries
Point defect materials problems

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Caractéristiques techniques

	PAPIER
Éditeur(s)	Cambridge University Press
Auteur(s)	David B. Holt, Ben Yacobi
Parution	01/04/2007
Nb. de pages	644
EAN13	9780521819343
ISBN13	978-0521-81934-3