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Ferroelectric Random Access Memories
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Ferroelectric Random Access Memories

Ferroelectric Random Access Memories

Fundamentals and Applications

Hiroshi Ishiwara, Masanori Okuyama, Yoshihiro Arimoto

290 pages, parution le 03/05/2004

Résumé

In fabrication of FeRAMs, various academic and technological backgrounds are necessary, which include ferroelectric materials, thin film formation, device physics, circuit design, and so on.This book covers from fundamentals to applications of ferroelectric random access memories (FeRAMs). The book consists of 5 parts; (i) ferroelectric thin films, (2) deposition and characterization methods, (3) fabrication process and circuit design, (4) advanced-type memories, and (5) applications and future prospects, and each part is further devided in several chapters. Because of the wide range of the discussed topics, each chapter in this book was written by one of the best authors knowing the specific topic very well. Thus, this is a good introduction book of FeRAM for graduate students and new comers to this field, as well as it helps specialists to understand FeRAMs more deeply.

Written for:
Researchers, scientists and engineers in semiconductor electronics and memory technology research and development

Sommaire

  • Part I Ferroelectric Thin Films
    • Overview
    • Novel Si-Substituted Ferroelectric Films
    • Static and Dynamic Properties of Domains
    • Nanoscale Phenomena in Ferroelectric Thin Films
  • Part II Deposition and Characterization Methods
    • The Sputtering Technique
    • A Chemical Approach Using Liquid Sources Tailored to Bi-Based Layer-Structured Perovskite Thin Films
    • Recent Development in the Preparation of Ferroelectric Thin Films by MOCVD
    • Materials Integration Strategies
    • Characterization by Scanning Nonlinear DielectricMicroscopy
  • Part III The Fabrication Process and Circuit Design
    • The Current Status of FeRAM
    • Operation Principle and Circuit Design Issues
    • High-Density Integration
    • Testing and Reliability
  • Part IV Advanced-Type Memories
    • Chain FeRAMs
    • Capacitor-on-Metal/Via-Stacked-Plug (CMVP) Memory Cell Technologies and Application to a Nonvolatile SRAM
    • The FET-Type FeRAM
  • Part V Applications and Future Prospects
    • Ferroelectric Technologies for Portable Equipment
    • The Application of FeRAM to Future Information Technology World
Voir tout
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Caractéristiques techniques

  PAPIER
Éditeur(s) Springer
Auteur(s) Hiroshi Ishiwara, Masanori Okuyama, Yoshihiro Arimoto
Parution 03/05/2004
Nb. de pages 290
Format 16 x 24
Couverture Relié
Poids 570g
Intérieur Noir et Blanc
EAN13 9783540407188

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