High-Resolution Imaging and Spectrometry of Materials

F. Ernst, M. Rühle

454 pages, parution le 24/12/2002

Ajouter à une liste

Indisponible

Résumé

This book gives a survey of, and systematic introduction to, high-resolution electron microscopy. The method is thoroughly discussed; the latest developments are reported; and applications to surface and interface analysis and to the study of hidden structures are detailed. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

Keywords: advanced electron optics, atom probe techniques, coherent electron techniques, electron probe techniques, high resolution imaging and spectrometry, scanning probe techniques

Contents

Microcharacterisation of Materials F. Ernst, W. Sigle
Electron Scattering H. Mšuller, H. Rose
Structure Determination by Quantitative High-Resolution Electron Microscopy (Q-HRTEM)
G. Möbus
Quantitative Analytical Transmission Electron Microscopy P. Kohler-Redlich, J. Mayer
Advances in Electron Optics H. Rose
Tomography by Atom Probe Field Ion Microscopy T. Al-Kassab, H. Wollenberger, G. Schmitz, R. Kirchheim
Scanning Tunneling Microscopy (STM) and Spectroscopy (STS), Atomic Force Microscopy (AFM) H. Neddermeyer, M. Hanbšucken
Multi-Method High-Resolution Surface Analysis with Slow Electrons E. Bauer, T. Schmidt
From Microcharacterization to Macroscopic Property: A Pathway Discussed on Metal/Ceramic Composites J. Ršodel
Microstructural Characterization of Materials: An Assessment R.W. Cahn, G. Ertl, J. Heydenreich

L'auteur - F. Ernst

Max Planck Institut für Metallforschung, Stuttgart, Germany

L'auteur - M. Rühle

Max Planck Institut,für Metallforschung, Stuttgart, Germany

Caractéristiques techniques

	PAPIER
Éditeur(s)	Springer
Auteur(s)	F. Ernst, M. Rühle
Parution	24/12/2002
Nb. de pages	454
Format	16 x 24
Couverture	Relié
Poids	875g
Intérieur	Noir et Blanc
EAN13	9783540418184