
Signal Integrity Effects in Custom IC and ASIC Designs
Résumé
Contents
Foreword
From the Early Days of CMOS to Today
Signal Integrity: A Problem for Design and CAD
Engineers
Preface
Acknowledgments
Signal Integrity Effects in Systme-on-Chip Designs - A
Designer's Perspective
Pt. 1 Interconnect Crosstalk
- Harmony: Static Noise Analysis of Deep Submicron Digital Integrated Circuits
- FastCap: A Multipole Accelerated 3-D Capacitance Extraction Program
- Efficient Coupled Noise Estimation for On-Chip Interconnects
- Switching Window Computation for Static Timing Analysis in Presence of Crosstalk Noise
- Digital Sensitivity: Predicting Signal Interaction using Functional Analysis
- Crosstalk Reduction for VLSI
- Noise-aware Repeater Insertion and Wire Sizing For On-Chip Interconnect Hierarchical Moment-Matching
- Post Global Routing Crosstalk Synthesis
- Minimum Crosstalk Channel Routing
- Reducing Cross-Coupling among Interconnect Wires in Deep-Submicron Datapath Design
- A Postprocessing Algorithm for Crosstalk-driven Wire Perturbation
- Noise in Digital Dynamic CMOS Circuits
- Design of Dynamic Circuits with Enhanced Noise Tolerance
- Coupling-Driven Signal Encoding Scheme for Low-Power Interface Design
- High Frequency Simulation and Characterization of Advanced Copper Interconnects
- Static Noise Analysis for Digital Integrated Circuits in Partially-Depleted Silicon-On-Insulator Technology
- Synthesis of CMOS Domino Circuits for Charge Sharing Alleviation
Pt. 2 Inductance Effects
- On-Chip Wiring Design Challenges for Gigahertz Operation
- IC Analyses Including Extracted Inductance Models
- FASTHENRY: A Multipole-Accelerated 3-D Inductance Extraction Program
- Full-Chip, Three-Dimensional, Shapes-Based RLC Extraction
- On-Chip Inductance Modeling and Analysis
- How to Efficiently Capture On-Chip Inductance Effects: Introducing a New Circuit Element K
- Figures of Merit to Characterize the Importance of On-Chip Inductance
- Layout-Techniques for Minimizing On-Chip Interconnect Self Inductance
- A Twisted-Bundle Layout Structure for Minimizing Inductive Coupling Noise
Pt. 3 Power Grid and Distribution Noise
- Full-Chip Verification of UDSM Designs
- Power Supply Noise in Future IC's: A Crystal Ball Reading
- A Floorplan-based Planning Methodology for Power and Clock Distribution in ASICs
- Power Supply Noise Analysis Methodology for Deep-Submicron VLSI Chip Design
- Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices
- Full-Chip Signal Interconnect Analysis for Electromigration Reliability
- Power Dissipation Analysis and Optimization of Deep Submicron CMOS Digital Circuits
- Simulation and Optimization of the Power Distribution Network in VLSI Circuits
- Design Strategies and Decoupling Techniques for Reducing the Effects of Electrical Interference in Mixed-Mode IC's
- Design and Analysis of Power Distribution Networks in Power PC Microprocessors
- Modeling the Power and Ground Effects of BGA Packages
- Effects of Power/Ground Via Distribution on the Power/Ground Performance of C4/BGA Packages
- Power Distribution Fidelity of Wirebond Compared to Flip Chip Devices in Grid Array Packages
- Forming Damped LRC Parasitic Circuits in Simultaneously Switched CMOS Output Buffers
Pt. 4 Substrate Noise
- Experimental Results and Modeling Techniques for Substrate Noise in Mixed-Signal Integrated Circuits
- Principles of Substrate Crosstalk Generation in CMOS Circuits
- Experimental Comparison of Substrate Noise Coupling Using Different Wafer Types
- Modeling and Analysis of Substrate Coupling in Integrated Circuits
- Fast Methods for Extraction and Sparsification of Substrate Coupling
- SUBWAVE: A Methodology for Modeling Digital Substrate Noise Injection in Mixed-Signal ICs
- Substrate Modeling and Lumped Substrate Resistance Extraction for CMOS ESD/Latchup Circuit Simulation
- Analysis of Ground-Bounce Induced Substrate Noise Coupling in a Low Resistive Bulk Epitaxial Process: Design Strategies to Minimize Noise Effects on a Mixed-Signal Chip
- A Methodology for Measurement and Characterization of Substrate Noise in High Frequency Circuits
- Measurement of Digital Noise in Mixed-Signal Integrated Circuits
- Effects of Substrate Resistances on LNA Performance and a Bondpad Structure for Reducing the Effects in a Silicon Bipolar Technology
- A Study of Oscillator Jitter Due to Supply and Substrate Noise
- CMOS Technology Characterization for Analog and RF Design
- Noise Reduction Is Crucial to Mixed-Signal ASIC Design Success (Parts I & II)
Subject Index
About the Editor
Caractéristiques techniques
PAPIER | |
Éditeur(s) | Wiley |
Auteur(s) | Raminderpal Singh |
Parution | 01/11/2001 |
Nb. de pages | 472 |
Format | 21,8 x 28,7 |
Couverture | Relié |
Poids | 1282g |
Intérieur | Noir et Blanc |
EAN13 | 9780471150428 |
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