Digital Logic Testing and Simulation

Alexandre Miczo

668 pages, parution le 07/08/2003 (2^eme édition)

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Résumé

Your road map for meeting today's digital testing challenges
Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge.

There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as:

Binary Decision Diagrams (BDDs) and cycle-based simulation
Tester architectures/Standard Test Interface Language (STIL)
Practical algorithms written in a Hardware Design Language (HDL)
Fault tolerance
Behavioral Automatic Test Pattern Generation (ATPG)
The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach

Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.

Preface
Introduction
Simulation
Fault Simulation
Automatic Test Pattern Generation
Sequential Logic Test
Automatic Test Equipment
Developing a Test Strategy
Design-For-Testability
Built-In-Self-Test
Memory Test
IDDQ
Behavioral Test and Verification
Index

L'auteur - Alexandre Miczo

PhD, has lectured extensively, both domestically and abroad, and is an adjunct professor at Santa Clara University.

Caractéristiques techniques

	PAPIER
Éditeur(s)	Wiley
Auteur(s)	Alexandre Miczo
Parution	07/08/2003
Édition	2^eme édition
Nb. de pages	668
Format	16 x 24
Couverture	Broché
Poids	1075g
Intérieur	Noir et Blanc
EAN13	9780471439950
ISBN13	978-0-471-43995-0