
Experimental Techniques for Low-Temperature Measurements
Cryostat Design, Material Properties, and Superconductor Critical-Current Testing
Résumé
- Broad readership across applied science.
- Extensively illustrated. Many charts and data tables included.
- A highly integrated text that builds a consistent, self-supporting knowledge base of low-temperature apparatus design, one idea at a time.
- Tutorial aspects include detailed discussions of low-temperature measurement techniques, construction techniques for measurement cryostats, operating procedures, vacuum technology, and safety.
- Covers many recent developments in low-temperature measurement techniques, superconductors, and scaling theory not previously published.
This book presents a highly integrated, step-by-step approach to the design and construction of low-temperature measurement apparatus. It is effectively two books in one: A textbook on cryostat design techniques and an appendix data handbook that provides materials-property data for carrying out that design. The main text encompasses a wide range of information, written for specialists, without leaving beginning students behind. After summarizing cooling methods, Part I provides core information in an accessible style on techniques for cryostat design and fabrication - including heat-transfer design, selection of materials, construction, wiring, and thermometry, accompanied by many graphs, data, and clear examples. Part II gives a practical user's perspective of sample mounting techniques and contact technology. Part III applies the information from Parts I and II to the measurement and analysis of superconductor critical currents, including in-depth measurement techniques and the latest developments in data analysis and scaling theory. The appendix is a ready reference handbook for cryostat design, encompassing seventy tables compiled from the contributions of experts and over fifty years of literature.
Readership: Graduates, researchers and professionals accross applied science, in particular in physics and materials science.
Sommaire
- Symbols and Abbreviations
- Acknowledgments
- About the Author
- Contact Information
- Disclaimer
- Cryostat Design and Materials Selection
- Electrical Transport Measurements: Sample Holders and Contacts
- Superconductor Critical-Current Measurements and Data Analysis
- Appendixes
- Index
Caractéristiques techniques
PAPIER | |
Éditeur(s) | Oxford University Press |
Auteur(s) | Jack W. Ekin |
Parution | 12/10/2006 |
Nb. de pages | 674 |
Format | 17,5 x 25 |
Couverture | Relié |
Poids | 1582g |
Intérieur | Noir et Blanc |
EAN13 | 9780198570547 |
ISBN13 | 978-0-19-857054-7 |
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