Neutron and X-Ray Spectroscopy

Françoise Hippert, Erik Geissler, Jean-Louis Hodeau, Eddy Lelièvre-Berna, Jean-René Regnard - Collection Grenoble Science

566 pages, parution le 21/12/2005

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Résumé

Scientific research involving neutrons or synchrotron radiation is performed in large experimental installations at a few sites around the world. Taking full advantage of such techniques requires a wide range of specialized expertise not found in any university course. Therefore, there is a need for reference books and training courses to introduce young scientists to the underlying principles and methods.

Neutron and X-Ray Spectroscopy delivers an up-to-date account of the principles and practice of inelastic and spectroscopic methods available at neutron and synchrotron sources, including recent developments. The chapters are based on a course of lectures and practicals (the HERCULES course at the European Synchrotron Radiation Facility) delivered to young scientists who require these methods in their professional careers. Each chapter, written by a leading specialist in the field, introduces the basic concepts of the technique and provides an overview of recent work. This volume, which focuses on spectroscopic techniques in synchrotron radiation and inelastic neutron scattering, will be a primary source of information for physicists, chemists and materials scientists who wish to acquire a basic understanding of these techniques and to discover the possibilities offered by them. Emphasizing the complementarity of the neutron and X-ray methods, this tutorial will also be invaluable to scientists already working in neighboring fields who seek to extend their knowledge.

Sommaire

Contributors
Foreword
Introduction
X-ray spectroscopy
- Fundamentals of X-ray absorption and dichroism: the multiplet approach
- Multiple scattering theory applied to X-ray absorption near-edge
- X-ray magnetic circular dichroism
- Extended X-ray absorption fine structure
- Inelastic X-ray scattering from collective atom dynamics
- Photoelectron spectroscopy
- Anomalous scattering and diffraction anomalous fine structure
- Soft X-ray photoelectron emission microscopy (X-PEEM)
- X-ray intensity fluctuation spectroscopy
- Vibrational spectroscopy at surfaces and interfaces using synchrotron sources and free electron lasers
Neutron spectroscopy
- Inelastic neutron scattering: introduction
- Three-axis inelastic neutron scattering
- Neutron spin echo spectroscopy
- Time of flight inelastic scattering
- Neutron backscattering spectroscopy
- Neutron inelastic scattering and molecular modelling
Index

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Caractéristiques techniques

	PAPIER
Éditeur(s)	Springer
Auteur(s)	Françoise Hippert, Erik Geissler, Jean-Louis Hodeau, Eddy Lelièvre-Berna, Jean-René Regnard
Collection	Grenoble Science
Parution	21/12/2005
Nb. de pages	566
Format	16 x 24,5
Couverture	Relié
Poids	1168g
Intérieur	Noir et Blanc
EAN13	9781402033360
ISBN13	978-1-4020-3336-0