
Polymer Microscopy
Linda C. Sawyer, David T. Grubb, Gregory F. Meyers
Résumé
Polymer Microscopy, Third Edition, is a comprehensive and practical guide to the study of the microstructure of polymers, and is the result of the authors' many years of academic and industrial experience. To address the needs of students and professionals from a variety of backgrounds, introductory chapters deal with the basic concepts of both polymer morphology and processing and microscopy and imaging theory. The core of the book is more applied, with many examples of specimen preparation and image interpretation leading to materials characterization. Microscopy is applied to the characterization of a wide range of polymer systems, including fibers, films, engineering resins and plastics, composites, nanocomposites, polymer blends, emulsions and liquid crystalline polymers. Light microscopy, atomic force microscopy, and scanning and transmission electron microscopy techniques are all considered, as are emerging techniques such as compositional mapping in which microscopy is combined with spectroscopy. This extensively updated and revised new edition closes with a problem solving guide, which provides a systematic framework for deciding on suitable approaches to the characterization of polymer microstructure.
Written for:
Any researcher or other materials professional in academia or industry working with polymer systems. Also suitable as a textbook for courses on polymer microscopy/materials characterization at the senior undergraduate or graduate level
Sommaire
- Preface to the second edition
- Acknowledgements
- Introduction to polymer morphology
- Fundamentals of microscopy
- Imaging theory
- Specimen preparation methods
- Polymer applications
- New techniques in polymer microscopy
- Problem solving summary
- Appendix I: Abbreviations of polymer names
- Appendix II: List of acronyms - techniques
- Appendix III: Manmade polymer fibres
- Appendix IV: Common commercial polymers and tradenames for plastics, films and engineering resins
- Appendix V: General suppliers of microscopy accessories
- Appendix VI: Suppliers of optical and electron microscopes
- Appendix VII: Suppliers of x-ray microanalysis equipment
- Appendix VIII: Suppliers of scanning probe microscopes
- Index
Caractéristiques techniques
PAPIER | |
Éditeur(s) | Springer |
Auteur(s) | Linda C. Sawyer, David T. Grubb, Gregory F. Meyers |
Parution | 01/05/2008 |
Édition | 3eme édition |
Nb. de pages | 540 |
Format | 17,8 x 25,7 |
Couverture | Relié |
Poids | 1500g |
Intérieur | Quadri |
EAN13 | 9780387726274 |
ISBN13 | 978-0-3877-2627-4 |
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