Physical Principles of Electron Microscopy

An Introduction TEM,SEM, and AEM

Ray F. Egerton

210 pages, parution le 12/10/2005

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Résumé

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Written for: Technologists, undergraduate and graduate students, university teachers and researchers

Sommaire

An Introduction to Microscopy
Electron Optics
The Transmission Electron Microscope
TEM Specimens and Images
The Scanning Electron Microscope
Analytical Electron Microscopy
Recent Developments
Appendix: Mathematical Derivations
A.1 The Schottky Effect
A.2 Impact Parameter in Rutherford Scattering

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Caractéristiques techniques

	PAPIER
Éditeur(s)	Springer
Auteur(s)	Ray F. Egerton
Parution	12/10/2005
Nb. de pages	210
Format	16 x 24,5
Couverture	Relié
Poids	430g
Intérieur	Noir et Blanc
EAN13	9780387258003
ISBN13	978-0-387-25800-3