Tous nos rayons

Déjà client ? Identifiez-vous

Mot de passe oublié ?

Nouveau client ?

CRÉER VOTRE COMPTE
Sampling, Wavelets, and Tomography
Ajouter à une liste

Librairie Eyrolles - Paris 5e
Indisponible

Sampling, Wavelets, and Tomography

Sampling, Wavelets, and Tomography

John J. Benedetto, Ahmed I. Zayed

345 pages, parution le 22/01/2004

Résumé

Sampling, Wavelets, and Tomography are three active areas of contemporary mathematics with numerous applications in signal and image processing and medical imaging technology. They share common roots that lie at the heart of harmonic and Fourier analysis. Also, the advent of new techniques in mathematical analysis has strengthened their interdependence and has led to new and interesting results. This state-of-the-art work reflects the contributions of renowned mathematicians and engineers, all experts in their respective areas. One of the key features of the book is an introductory chapter, written by the editors, to stress the interdependence of the three areas covered. Part I deals with sampling issues, both theoretical and applied. On the theoretical front, the mathematical foundations of sampling as related to sampling in general function spaces are presented, as well as in the multiresolution analysis setting. The applied issues include sampling of linear and stochastic processes, sampling in signal analysis and image processing, data compression, digital filtering, and error analysis. Part II includes chapters on wavelets, multiresolution analysis, frames, and Gabor analysis, while Part III is devoted entirely to tomography and medical imaging. This book will serve as a comprehensive reference text in all of the above subjects as well as a supplementary graduate text in seminars treating applications of harmonic analysis.

Written for:
Graduate students, applied mathematicians, engineers, practitioners

L'auteur - John J. Benedetto

Editor

Sommaire

  • A Prelude to Sampling, Wavelets, and Tomography (Ahmed I. Zayed)
  • Part I: Sampling and Frames
    • Sampling Without Input Constraints: Consistent Reconstruction in Arbitrary Spaces (Yonina C. Eldar)
    • An Introduction to Irregular Weyl-Heisenberg Frames (Peter G. Casazza)
    • Robustness of Regular Sampling in Sobolev Algebras (Hans G. Feichtinger and Tobias Werther)
    • Adaptive Irregular Sampling in Meshfree Flow Simulation (Armin Iske)
  • Part II: Wavelets
    • Polynomial Matrix Factorization, Multidimensional Filter Banks and Wavelets (N. K. Bose and S. Lertrattanapanich)
    • Sampling Theorems for Non-Bandlimited Signals (P. P. Vaidyanathan)
    • Function Spaces Based on Wavelet Expansions (Stéphane Jaffard)
    • Generalized Frame Multiresolution Analysis of Abstract Hilbert Spaces (Manos Papadakis)
  • Part III: Tomography
    • Sampling Theory and Parallel-Beam Tomography (Adel Faridani)
    • Filtered Backprojection Algorithms For Spiral Cone Beam CT (Alexander Katsevich and Guenter Lauritsch)
    • Thin-Plate Spline Interpolation (David C. Wilson and Bernard Mair)
    • Index
Voir tout
Replier

Caractéristiques techniques

  PAPIER
Éditeur(s) Birkhäuser
Auteur(s) John J. Benedetto, Ahmed I. Zayed
Parution 22/01/2004
Nb. de pages 345
Format 16 x 24
Couverture Relié
Poids 635g
Intérieur Noir et Blanc
EAN13 9780817643041
ISBN13 978-0-8176-4304-1

Avantages Eyrolles.com

Livraison à partir de 0,01 en France métropolitaine
Paiement en ligne SÉCURISÉ
Livraison dans le monde
Retour sous 15 jours
+ d'un million et demi de livres disponibles
satisfait ou remboursé
Satisfait ou remboursé
Paiement sécurisé
modes de paiement
Paiement à l'expédition
partout dans le monde
Livraison partout dans le monde
Service clients 0 321 79 56 75 sav@commande.eyrolles.com
librairie française
Librairie française depuis 1925