World Class Reliability

Using Multiple Environment Overstress Tests to Make it Happen

Keki R. Bhote, Adi Bhote

218 pages, parution le 20/04/2004

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Résumé

Making sure your product's straight-from-the-line quality lasts in the field.

Six Sigma has been a giant in the quality movement but has been a pygmy in improving field reliability, i.e., reducing failure rates for customers. Traditional reliability techniques are woefully inadequate and produce fictitious reliability numbers.

World Class Reliability, by contrast, presents a powerful technique to improve reliability by factors of 10:1 and even 100:1. It is Multiple Environment Overstress Tests (MEOST), used by NASA on its famous Lunar Module. Field failures that are found, traditionally, only after months of field exposure can now be "smoked out" in hours in the design laboratory and rapidly corrected; MEOST achieves this by combining several stresses and taking them beyond design stress very, very rapidly.

The result: fantastic reliability improvements; much reduced design cost, manpower, and cycle time; speed to market well ahead of competition; customer loyalty and dramatic profit enhancements for corporations.

L'auteur - Keki R. Bhote

Keki R. Bhote L'auteur, ancien directeur de la qualité de Motorola, est président de Keki R. Bhote Associates, cabinet de conseil en qualité et amélioration de la productivité. Il a été désigné par le magazine Quality Digest comme un des gourous de la qualité aux États-Unis.

L'auteur - Adi Bhote

Adi Bhote (Glencoe, IL), a 13-year Motorola veteran, is Vice President of Keki R. Bhote Associates. Keki Bhote and Adi Bhote are the coauthors of World Class Quality.

Sommaire

The Challenge for Industry: Regaining Lost Profits
What not to do: Current but ineffective Reliability Methodologies
The Climb to MEOST: The Mount Everest of Reliability

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Caractéristiques techniques

	PAPIER
Éditeur(s)	Amacom
Auteur(s)	Keki R. Bhote, Adi Bhote
Parution	20/04/2004
Nb. de pages	218
Format	15,5 x 23,5
Couverture	Relié
Poids	480g
Intérieur	Noir et Blanc
EAN13	9780814407929
ISBN13	978-0-8144-0792-9